Agilent Semiconductor Parameter Analyzer

January 27, 2018
HP/Agilent 4145B Semiconductor

Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.

Keysight EasyEXPERT group+ GUI based characterization software is available either on the B1500A’s embedded Windows 7 platform with 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight B1500A provides the complete solution for device characterization with these versatile capabilities.

B1500A supports various modules and allows you to configure them up to 10 slots, according to your measurement needs. Standard SMU modules enable to perform various IV measurements such as spot, sweep, sampling measurements. Moreover, Quasi-Static CV (QSCV) measurement is also supported by SMU. MFCMU modules supports capacitance measurement and easy and yet IV/CV switching with the optional SCUU. WGFMU enables ultra-fast pulsed IV and dynamic IV measurement for cutting-edge applications based on arbitrary waveform sourcing and fast digitizing measurement capabilities. The combination of these modules cover various applications.

HP Agilent 4155A Semiconductor Parameter Analyzer, For Sale
HP Agilent 4155A Semiconductor Parameter Analyzer, For Sale
HP/Agilent 4155B Semiconductor Parameter Analyzer, For Sale
HP/Agilent 4155B Semiconductor Parameter Analyzer, For Sale
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